Use the Fluke 1760 to constantly log power quality information from 8 separate input channels (connect 4 current/4 voltage or up to 8 voltage channels simultaneously).
Designed for use out in the field, the Fluke 1760 is rugged and reliable enough to withstand any kind of environment and is designed to be left constantly logging power information over a time period directly onto an SD card that's included as standard with the tester. This information can then be downloaded once testing is completed and interacted with further via the use of an included software package.
The 1760 is designed to log a comprehensive range of values, including voltage events (dips, swells and interruptions) and can constantly log total harmonic distortion, voltage and current harmonics up to the 50th/interharmonics, frequency, unbalance, flicker, kWh, power factor, power (P, Q and S), current and voltage (via the use of included flexible current probes and voltage probes).
Spend £150+ (Ex VAT) on any qualified Fluke or Beha-Amprobe product(s) and claim a free tool of your choice from the list at Fluke Promotion. Valid February 17 2025 - July 31 2025.
Claims are made direct to Fluke. For more information and terms and conditions, visit Fluke Promotion.
Overview of Measurement Functions | |||||||||||||||||||||||||||||
Statistical Evaluation |
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Event List |
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Continuous Recording |
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Triggered Recordings |
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Mains Signalling |
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Online Mode |
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General Data | |||||||||||||||
Intrinsic uncertainty |
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Quality system |
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Environment conditions |
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Reference conditions |
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Housing |
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EMC |
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Power supply |
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Display |
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Data memory |
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Memory model |
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Interfaces |
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Baud rate for RS 232 |
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Dimensions |
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Weight |
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Warranty |
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Calibration interval |
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Signal Conditioning | |||||||
Range for 50 Hz systems |
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Range for 60 Hz systems |
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Resolution |
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Sampling frequency for 50 Hz power frequency |
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Uncertainty for frequency measurements |
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Uncertainty of internal clock |
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Measurement intervals |
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Harmonics |
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Flicker |
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Measurement Inputs | |||||
Number of inputs |
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Sensor safety |
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Basic safety |
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Nominal voltage (rms) |
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Range (peak value) |
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Overload capacity (rms) |
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Voltage rise rate |
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Input resistance |
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Input capacitance |
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Input filter |
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Uncertainties | |||||||
Uncertainty at reference conditions |
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Intrinsic uncertainty for harmonics |
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Reference conditions |
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Temperature drift |
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Aging |
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Common mode rejection |
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Temperature drift |
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Aging |
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Noise |
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DC |
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